single event effects

About this tag
The single event effects tag on WindowsForum.com covers discussions about radiation-induced errors in semiconductor devices used in space and other high-radiation environments. Content includes NASA NEPP testing of the SAKURA-II AI accelerator, which demonstrated immunity to destructive single event effects and only limited, recoverable error modes. This testing supports the viability of low-power edge AI for space missions. The tag focuses on single event effects characterization, heavy-ion testing, and reliability of electronics for LEO, GEO, and lunar applications.

  1. NASA NEPP Tests Sakura II: Non Destructive SEE Profile for Space Edge AI

    NASA’s NEPP heavy‑ion campaign at Texas A&M has cleared EdgeCortix’s SAKURA‑II accelerator of destructive single‑event effects and recorded only limited, recoverable error modes — a result that moves low‑power, on‑board AI from conceptual promise toward operational plausibility for LEO, GEO and...
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    • edge ai radiation testing single event effects weibull modeling
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    • Forum: Windows News